Maximum leave-one-out likelihood for kernel density estimation
dc.contributor.author | Barnard, Etienne | |
dc.date.accessioned | 2018-03-07T10:01:49Z | |
dc.date.available | 2018-03-07T10:01:49Z | |
dc.date.issued | 2010 | |
dc.description.abstract | We investigate the application of kernel density estimators to pattern-recognition problems. These estimators have a number of attractive properties for data analysis in pattern recognition, but the particular characteristics of patternrecognition problems also place some non-trivial requirements on kernel density estimation – especially on the algorithm used to compute bandwidths. We introduce a new algorithm for variable bandwidth estimation, investigate some of its properties, and show that it performs competitively on a wide range of tasks, particularly in spaces of high dimensionality. | en_US |
dc.description.sponsorship | Multilingual Speech Technologies Group, North-West University, Vanderbijlpark, South Africa | en_US |
dc.identifier.citation | Etienne Barnard, “Maximum leave-one-out likelihood for kernel density estimation”, in Proc. Annual Symp. Pattern Recognition Association of South Africa (PRASA), pp 19-24, Stellenbosch, South Africa, 2010. [http://engineering.nwu.ac.za/multilingual-speech-technologies-must/publications] | en_US |
dc.identifier.uri | http://www.prasa.org/proceedings/2010/prasa2010-04.pdf | |
dc.identifier.uri | https://www.researchgate.net/publication/228960852_Maximum_Leave-one-out_Likelihood_for_Kernel_Density_Estimation | |
dc.identifier.uri | http://hdl.handle.net/10394/26552 | |
dc.language.iso | en | en_US |
dc.publisher | Pattern Recognition Association of South Africa and Mechatronics International Conference | en_US |
dc.subject | Maximum Leave-one-out Likelihood | en_US |
dc.subject | Kernel Density Estimation | en_US |
dc.subject | Pattern-recognition problems | en_US |
dc.subject | Algorithm for variable bandwidth estimation | en_US |
dc.title | Maximum leave-one-out likelihood for kernel density estimation | en_US |
dc.type | Presentation | en_US |
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